Exploiting Process Variation for Write Performance...

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2015

Exploiting Process Variation for Write Performance Improvement on NAND Flash Memory Storage Systems

Shi, Liang, Di, Yejia, Zhao, Mengying, Xue, Chun Jason, Wu, Kaijie, Sha, Edwin H.-M.
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2015.2393299
File:
PDF, 838 KB
english, 2015
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