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Exploiting Process Variation for Write Performance Improvement on NAND Flash Memory Storage Systems
Shi, Liang, Di, Yejia, Zhao, Mengying, Xue, Chun Jason, Wu, Kaijie, Sha, Edwin H.-M.Year:
2015
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2015.2393299
File:
PDF, 838 KB
english, 2015