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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2013) - Beijing, China (Sunday 17 November 2013)] 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology - Novel invariant Zernike moments as a shape descriptor for machine vision
Cao, Danhua, Jiang, Shixiong, Wu, Yubin, Zhu, Song, Lin, Xinggang, Zheng, JesseVolume:
9045
Year:
2013
Language:
english
DOI:
10.1117/12.2036877
File:
PDF, 242 KB
english, 2013