SPIE Proceedings [SPIE 31st Annual Technical Symposium - San Diego, CA (Sunday 17 August 1986)] Photomechanics and Speckle Metrology - Application Of Moire Analysis Of Strain Using Fourier Transform
Morimoto, Yoshiharu, Seguchi, Yasuyuki, Higashi, Toshihiko, Chiang, Fu-PenVolume:
814
Year:
1987
Language:
english
DOI:
10.1117/12.941711
File:
PDF, 5.32 MB
english, 1987