SPIE Proceedings [SPIE 31st Annual Technical Symposium -...

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SPIE Proceedings [SPIE 31st Annual Technical Symposium - San Diego, CA (Sunday 17 August 1986)] Photomechanics and Speckle Metrology - Application Of Moire Analysis Of Strain Using Fourier Transform

Morimoto, Yoshiharu, Seguchi, Yasuyuki, Higashi, Toshihiko, Chiang, Fu-Pen
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Volume:
814
Year:
1987
Language:
english
DOI:
10.1117/12.941711
File:
PDF, 5.32 MB
english, 1987
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