SPIE Proceedings [SPIE Symposium on Integrated Optics - San Jose, CA (Saturday 20 January 2001)] Testing, Reliability, and Applications of Optoelectronic Devices - Metal-semiconductor-metal photodetectors
Berger, Paul R., Chin, Aland K., Dutta, Niloy K., Linden, Kurt J., Wang, S. C.Volume:
4285
Year:
2001
Language:
english
DOI:
10.1117/12.426888
File:
PDF, 417 KB
english, 2001