Subpixel edge localization with reduced uncertainty by...

Optical Engineering 2014 / 06 Vol. 53; Iss. 12

Subpixel edge localization with reduced uncertainty by violating the Nyquist criterion

Heidingsfelder, Philipp, Gao, Jun, Wang, Kun, Ott, Peter
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Volume:
53
Language:
english
Journal:
Optical Engineering
DOI:
10.1117/1.OE.53.12.122410
Date:
June, 2014
File:
PDF, 1.25 MB
english, 2014
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