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SPIE Proceedings [SPIE 1989 Microlithography Conferences - San Jose, CA (Monday 27 February 1989)] Electron-Beam, X-Ray, and Ion-Beam Technology: Submicrometer Lithographies VIII - Electron Beam Lithography And Resist Processing For The Fabrication Of T-Gate Structures
Tiberio, R. C., Limber, J. M., Galvin, G. J., Wolf, E. D., Yanof, Arnold W.Volume:
1089
Year:
1989
Language:
english
DOI:
10.1117/12.968521
File:
PDF, 15.31 MB
english, 1989