SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Manufacturing and Testing VIII - Non-null interferometric aspheric testing with partial null lens and reverse optimization
Liu, Dong, Burge, James H., Fähnle, Oliver W., Yang, Yongying, Luo, Yongjie, Williamson, Ray, Tian, Chao, Shen, Yibing, Zhuo, YongmoVolume:
7426
Year:
2009
Language:
english
DOI:
10.1117/12.824534
File:
PDF, 427 KB
english, 2009