Trap-Profile Extraction Using High-Voltage...

IEEE Transactions on Electron Devices 2015 / 3 Vol. 62; Iss. 3

Trap-Profile Extraction Using High-Voltage Capacitance–Voltage Measurement in AlGaN/GaN Heterostructure Field-Effect Transistors With Field Plates

Liao, Wen-Chia, Chyi, Jen-Inn, Hsin, Yue-Ming
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2395720
Date:
March, 2015
File:
PDF, 1.06 MB
english, 2015
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