SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Terahertz Spectroscopy and Applications II - Quasi-optical characterization of waveguides at frequencies above 100 GHz
Hadjiloucas, Silas, Bowen, John W., Digby, John W., Chamberlain, J. Martyn, Steenson, David P., Chamberlain, J. MartynVolume:
3828
Year:
1999
Language:
english
DOI:
10.1117/12.361058
File:
PDF, 300 KB
english, 1999