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SPIE Proceedings [SPIE International Symposium on Photonics and Applications - Singapore, Singapore (Monday 29 November 1999)] Advanced Photonic Sensors and Applications - Automatic measurement equipment for quality control in the loop-slitting department
Hussmann, Stephan, Kleuver, Wolfram, Guenther, Bernd, Groeneweller, Joerg, Rath, Holger, Lieberman, Robert A., Asundi, Anand K., Asanuma, HiroshiVolume:
3897
Year:
1999
Language:
english
DOI:
10.1117/12.369323
File:
PDF, 985 KB
english, 1999