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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Optical Diagnostic Methods for Inorganic Materials III - Analysis and representation of BSDF and BRDF measurements
Thomas, Michael E., Blodgett, David W., Hahn, Daniel V., Hanssen, Leonard M.Volume:
5192
Year:
2003
Language:
english
DOI:
10.1117/12.508560
File:
PDF, 298 KB
english, 2003