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Characterisation of Solid Supported Nanostructured Thin Films by Scanning Angle Reflectometry and UV-Vis Spectrometry
Deák, András, Hild, Erzsébet, Kovács, Attila L., Hórvölgyi, ZoltánVolume:
537-538
Year:
2007
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.537-538.329
File:
PDF, 654 KB
english, 2007