Picosecond Damage Studies At 0.5 And 1 µm

Optical Engineering 1983 / 08 Vol. 22; Iss. 4

Picosecond Damage Studies At 0.5 And 1 µm

Soileau, M. J.
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Volume:
22
Language:
english
Journal:
Optical Engineering
DOI:
10.1117/12.7973138
Date:
August, 1983
File:
PDF, 375 KB
english, 1983
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