Exploration of the ultimate patterning potential of focused...

Exploration of the ultimate patterning potential of focused ion beams

Gierak, J.
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Volume:
5
Language:
english
Journal:
Journal of Micro/Nanolithography, MEMS, and MOEMS
DOI:
10.1117/1.2181581
Date:
January, 2006
File:
PDF, 1.02 MB
english, 2006
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