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SPIE Proceedings [SPIE 1977 SPIE/SPSE Technical Symposium East - Reston (Monday 18 April 1977)] Far Infrared/Submillimeter Wave: Technology/Applications - Far Infrared Imaging For Quality Control
Cheo, P. K., Hartwick, Thomas S., Hodges, Dean T.Volume:
105
Year:
1977
Language:
english
DOI:
10.1117/12.955448
File:
PDF, 17 KB
english, 1977