Structural Properties Studies of GaN on 6H-SiC by Means of...

Advanced Materials Research 2010 / 12 Vol. 173

Structural Properties Studies of GaN on 6H-SiC by Means of X-Ray Diffraction Technique

Guan, Ching Chin, Ng, Sha Shiong, Hassan, Zainuriah, Abu Hassan, Haslan
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Volume:
173
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.173.40
Date:
December, 2010
File:
PDF, 335 KB
english, 2010
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