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SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition - Non-local means-based nonuniformity correction for infrared focal-plane array detectors
Sharma, Gaurav, Zhou, Fugen, Liu, Jennifer, Yu, Hui, Zhang, Zhi-jie, Chen, Fu-sheng, Wang, Chen-shengVolume:
9301
Year:
2014
Language:
english
DOI:
10.1117/12.2074379
File:
PDF, 738 KB
english, 2014