SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 3 February 2013)] Image Processing: Machine Vision Applications VI - High-temperature dual-band thermal imaging by means of high-speed CMOS camera system
Hauer, W., Zauner, G., Bingham, Philip R., Lam, Edmund Y.Volume:
8661
Year:
2013
Language:
english
DOI:
10.1117/12.2002357
File:
PDF, 1.88 MB
english, 2013