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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 12 August 2012)] Optical Trapping and Optical Micromanipulation IX - Power spectral density integration analysis and its application to large bandwidth, high precision position measurements
Kochanczyk, Martin D., Dholakia, Kishan, Spalding, Gabriel C., Bartsch, Tobias F., Taute, Katja M., Florin, Ernst-LudwigVolume:
8458
Year:
2012
Language:
english
DOI:
10.1117/12.929349
File:
PDF, 849 KB
english, 2012