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SPIE Proceedings [SPIE 29th Annual Technical Symposium - San Diego (Tuesday 20 August 1985)] Applications of Thin Film Multilayered Structures to Figured X-Ray Optics - Determination Of Thickness Errors And Boundary Roughness From The Measured Performance Of A Multilayer Coating
Spiller, Eberhard, Rosenbluth, Alan E., Marshall, Gerald F.Volume:
563
Year:
1985
Language:
english
DOI:
10.1117/12.949671
File:
PDF, 622 KB
english, 1985