Non-destructive analysis of small irregularly shaped homogenous samples by X-ray fluorescence spectrometry
M. Bos, J.A.M. Vrielink, W.E. van der LindenVolume:
412
Year:
2000
Language:
english
Pages:
9
DOI:
10.1016/s0003-2670(00)00771-6
File:
PDF, 69 KB
english, 2000