![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Non-Destructive Evaluation Techniques for Aging Infrastructure & Manufacturing - San Antonio, TX (Tuesday 31 March 1998)] Process Control and Sensors for Manufacturing - Residual stress characterization of welds and post-weld processes using x-ray diffraction techniques
Brauss, Michael E., Pineault, James A., Eckersley, John S., Bossi, Richard H., Pepper, David M.Volume:
3399
Year:
1998
Language:
english
DOI:
10.1117/12.302553
File:
PDF, 315 KB
english, 1998