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SPIE Proceedings [SPIE 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014) - Harbin, China (Saturday 26 April 2014)] 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging - The simulation and analysis of infrared target multi-band characteristics
Jiang, Yadong, Yu, Junsheng, Kippelen, Bernard, Cui, Lanfang, Zhou, JinmeiVolume:
9284
Year:
2014
Language:
english
DOI:
10.1117/12.2069212
File:
PDF, 291 KB
english, 2014