Mechanical Spectroscopy of Silicon as a Low Loss Material...

Solid State Phenomena 2012 / 1 Vol. 184

Mechanical Spectroscopy of Silicon as a Low Loss Material for High Precision Mechanical and Optical Experiments

Schwarz, C., Heinert, D., Haughian, K., Hofmann, G., Komma, J., Martin, I. W., Murray, P., Rowan, S., Seidel, P., Nawrodt, R.
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Volume:
184
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.184.443
Date:
January, 2012
File:
PDF, 651 KB
english, 2012
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