![](/img/cover-not-exists.png)
[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - Design, Verification, and Application of IEEE 1687
Zadegan, Farrokh Ghani, Larsson, Erik, Jutman, Artur, Devadze, Sergei, Krenz-Baath, ReneYear:
2014
Language:
english
DOI:
10.1109/ATS.2014.28
File:
PDF, 347 KB
english, 2014