[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou,...

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[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - Design, Verification, and Application of IEEE 1687

Zadegan, Farrokh Ghani, Larsson, Erik, Jutman, Artur, Devadze, Sergei, Krenz-Baath, Rene
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Year:
2014
Language:
english
DOI:
10.1109/ATS.2014.28
File:
PDF, 347 KB
english, 2014
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