SPIE Proceedings [SPIE Design, Test, and Microfabrication of MEMS/MOEMS - Paris, France (Tuesday 30 March 1999)] Design, Test, and Microfabrication of MEMS and MOEMS - Characterization of porous silicon for solar cell application by atomic force microscopy
Simkiene, I., Snitka, Valentinas J., Naudzius, Kestutis, Pacebutas, Vaidas, Rackaitis, Mindaugas, Courtois, Bernard, Crary, Selden B., Ehrfeld, Wolfgang, Fujita, Hiroyuki, Karam, Jean Michel, Markus,Volume:
3680
Year:
1999
Language:
english
DOI:
10.1117/12.341190
File:
PDF, 1.10 MB
english, 1999