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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2011 - Beijing, China (Tuesday 24 May 2011)] International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications - Characterization of CdTe passivation layers grown by evaporation with thermal treatments
Xu, Jing-jie, Li, Hai-bin, Chen, Xing-guo, Wei, Yan-feng, Lin, Chun, Yang, Jian-rongVolume:
8193
Year:
2012
Language:
english
DOI:
10.1117/12.900748
File:
PDF, 431 KB
english, 2012