Thickness measurements of metal thin films with a plasmonic near-field scanning nanoscope using a resonant ridge aperture
Lee, Taekyong, Oh, Seonghyeon, Hahn, Jae W.Volume:
8
Language:
english
Journal:
Journal of Nanophotonics
DOI:
10.1117/1.jnp.8.083075
Date:
August, 2014
File:
PDF, 2.22 MB
english, 2014