Thickness measurements of metal thin films with a plasmonic...

Thickness measurements of metal thin films with a plasmonic near-field scanning nanoscope using a resonant ridge aperture

Lee, Taekyong, Oh, Seonghyeon, Hahn, Jae W.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8
Language:
english
Journal:
Journal of Nanophotonics
DOI:
10.1117/1.jnp.8.083075
Date:
August, 2014
File:
PDF, 2.22 MB
english, 2014
Conversion to is in progress
Conversion to is failed