SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Flat Panel Display Technology and Display Metrology II - Polycrystalline silicon thin film transistor technology for flexible large-area electronics
Tung, YehJiun, Carey, Paul G., Smith, Patrick M., Theiss, Steven D., Wickboldt, Paul, Meng, Xiaofan, Weiss, Robert E., Davis, Gary A., Aebi, Verle W., King, Tsu-Jae, Kelley, Edward F., Voutsas, ApostoVolume:
4295
Year:
2001
Language:
english
DOI:
10.1117/12.424862
File:
PDF, 89 KB
english, 2001