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SPIE Proceedings [SPIE Photonics West '98 Electronic Imaging - San Jose, CA (Saturday 24 January 1998)] Scientific Detection of Fakery in Art - Microscopical examination of art and archeological objects
McCrone, Walter, McCrone, Walter, Chartier, Duane R., Weiss, Richard J.Volume:
3315
Year:
1998
Language:
english
DOI:
10.1117/12.308584
File:
PDF, 504 KB
english, 1998