SPIE Proceedings [SPIE Polarimetry and Ellipsometry -...

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SPIE Proceedings [SPIE Polarimetry and Ellipsometry - Kazimierz Dolny, Poland (Monday 20 May 1996)] Polarimetry and Ellipsometry - Application of polarimetry in optical computerized tomography of anisotropic media

Berezhna, S. Y., Berezhnyi, I. V., Krupych, O. M., Vlokh, Orest G., Pluta, Maksymilian, Wolinski, Tomasz R.
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Volume:
3094
Year:
1997
Language:
english
DOI:
10.1117/12.271811
File:
PDF, 346 KB
english, 1997
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