Full-field heterodyne interferometry using a complementary...

Full-field heterodyne interferometry using a complementary metal-oxide semiconductor digital signal processor camera for high-resolution profilometry

Lakestani, Fereydoun
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Volume:
46
Language:
english
Journal:
Optical Engineering
DOI:
10.1117/1.2779346
Date:
September, 2007
File:
PDF, 283 KB
english, 2007
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