An Circuit Fault Diagnosis Method with K-Means Kernel Density Estimation
Tang, Jing, Shi, Xian Jun, Zhang, Wen GuangVolume:
66-68
Language:
english
Journal:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/AMM.66-68.203
Date:
July, 2011
File:
PDF, 288 KB
english, 2011