SPIE Proceedings [SPIE Optoelectronics '99 - Integrated Optoelectronic Devices - San Jose, CA (Saturday 23 January 1999)] Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV - Almost temperature-insensitive characteristics in 1.06-μm InGaAs laser diodes with strain-compensating electron-barrier layers
Hayakawa, Toshiro, Asano, Hideki, Wada, Mitsugu, Fukunaga, Toshiaki, Fallahi, Mahmoud, Linden, Kurt J., Wang, S. C.Volume:
3626
Year:
1999
Language:
english
DOI:
10.1117/12.345420
File:
PDF, 441 KB
english, 1999