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SPIE Proceedings [SPIE Optical Systems Design 2005 - Jena, Germany (Monday 12 September 2005)] Advances in Optical Thin Films II - Comparison of optical resistance of ion assisted deposition and standard electron beam deposition methods for high reflectance dielectric coatings
Melninkaitis, A., Maciulevicius, M., Rakickas, T., Miksys, D., Grigonis, R., Sirutkaitis, V., Skrebutenas, A., Buzelis, R., Drazdys, R., Abromavicius, G., Amra, Claude, Kaiser, Norbert, Macleod, H. AnVolume:
5963
Year:
2005
Language:
english
DOI:
10.1117/12.619987
File:
PDF, 488 KB
english, 2005