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SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Optical Information Processing Technology - Pattern recognition for optical PSI images of surface topography using wavelets
Jiang, Xiangqian, Xiao, Shaojun, Blunt, Liam, Mu, Guoguang, Yu, Francis T. S., Jutamulia, SugandaVolume:
4929
Year:
2002
Language:
english
DOI:
10.1117/12.483206
File:
PDF, 217 KB
english, 2002