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SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Growth and structural characterization of ZnF2 epitaxial layers on Si
Banshchikov, A. G., Kartenko, N. F., Kaveev, A. K., Moisseeva, M. M., Sokolov, Nikolai S., Alferov, Zhores I., Esaki, LeoYear:
2012
Language:
english
DOI:
10.1117/12.510497
File:
PDF, 132 KB
english, 2012