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SPIE Proceedings [SPIE Eighth International Conference on Thin Film Physics and Applications (TFPA13) - Shanghai, China (Friday 20 September 2013)] Eighth International Conference on Thin Film Physics and Applications - Dependence of annealing temperature on microstructure and photoelectrical properties of vanadium oxide thin films prepared by DC reactive sputtering
Li, Yan, Zhang, Dongping, Wang, Bo, Liang, Guangxing, Zheng, Zhuanghao, Luo, Jingting, Cai, Xingmin, Fan, Ping, Chu, Junhao, Wang, ChunruiVolume:
9068
Year:
2013
Language:
english
DOI:
10.1117/12.2054097
File:
PDF, 1.20 MB
english, 2013