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SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Design and Testing VI - 3D goes digital: from stereoscopy to modern 3D imaging techniques

Wang, Yongtian, Du, Chunlei, Sasián, José, Tatsuno, Kimio, Kerwien, N.
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Volume:
9272
Year:
2014
Language:
english
DOI:
10.1117/12.2073658
File:
PDF, 431 KB
english, 2014
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