Analysis of Intra-Grain Defects in Multicrystalline Silicon...

Japanese Journal of Applied Physics 2006 / 6 Vol. 45; Iss. No. 25

Analysis of Intra-Grain Defects in Multicrystalline Silicon Wafers by Photoluminescence Mapping and Spectroscopy

Sugimoto, Hiroki, Inoue, Masaaki, Tajima, Michio, Ogura, Atsushi, Ohshita, Yoshio
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Volume:
45
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.45.l641
Date:
June, 2006
File:
PDF, 236 KB
english, 2006
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