Capacitance Voltage Characteristics and Electron Holography on Cubic AlGaN/GaN Heterojunctions
As, Donat J., Zado, Alexander, Wei, Qiyang Y., Li, Ti, Huang, Jingyi Y., Ponce, Fernando A.Volume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.52.08JN04
Date:
August, 2013
File:
PDF, 172 KB
english, 2013