SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] EUV, X-Ray, and Neutron Optics and Sources - Optical constants of sputtered U and a-Si at 30.4 and 58.4 nm
Squires, Matthew B., Allred, David D., Turley, R. Steven, MacDonald, Carolyn A., Goldberg, Kenneth A., Maldonado, Juan R., Chen-Mayer, Huaiyu H., Vernon, Stephen P.Volume:
3767
Year:
1999
Language:
english
DOI:
10.1117/12.371141
File:
PDF, 260 KB
english, 1999