Microwave damage susceptibility trend of a bipolar transistor as a function of frequency
Ma, Zhen-Yang, Chai, Chang-Chun, Ren, Xing-Rong, Yang, Yin-Tang, Chen, Bin, Song, Kun, Zhao, Ying-BoVolume:
21
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/21/9/098502
Date:
September, 2012
File:
PDF, 1.30 MB
english, 2012