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XCT analysis of the influence of melt strategies on defect population in Ti–6Al–4V components manufactured by Selective Electron Beam Melting
Tammas-Williams, S., Zhao, H., Léonard, F., Derguti, F., Todd, I., Prangnell, P.B.Volume:
102
Language:
english
Journal:
Materials Characterization
DOI:
10.1016/j.matchar.2015.02.008
Date:
April, 2015
File:
PDF, 1.10 MB
english, 2015