SPIE Proceedings [SPIE Lasers and Optics in Manufacturing III - Munich, Germany (Monday 16 June 1997)] Optical Inspection and Micromeasurements II - Methods of digital holography: a comparison
Kreis, Thomas M., Adams, Mike, Jueptner, Werner P. O., Gorecki, ChristopheVolume:
3098
Year:
1997
Language:
english
DOI:
10.1117/12.281164
File:
PDF, 1.27 MB
english, 1997