Investigation of Thermal Properties of Thin Semiconductor...

Defect and Diffusion Forum 2010 / 4 Vol. 297-301

Investigation of Thermal Properties of Thin Semiconductor Layers Deposited on a Glass Substrate by the Photothermal Deflection Technique

Gaied, Imen, Rabeh, Mohamed Ben, Rabhi, Adel, Kanzari, Mounir, Yacoubi, Noureddine
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Volume:
297-301
Language:
english
Journal:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/DDF.297-301.537
Date:
April, 2010
File:
PDF, 350 KB
english, 2010
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