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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Interferometry XIV: Techniques and Analysis - Distortion mapping correction in aspheric null testing
Novak, M., Schmit, Joanna, Creath, Katherine, Zhao, C., Burge, J. H., Towers, Catherine E.Volume:
7063
Year:
2008
Language:
english
DOI:
10.1117/12.798151
File:
PDF, 1.20 MB
english, 2008