Microinhomogeneities Characterized by Photocurrent...

Materials Science Forum 1989 Vol. 38-41

Microinhomogeneities Characterized by Photocurrent Measurements and the Sem-Ebic Technique in Alpha-Si:H Layers

Füstöss-Wegner, M., Pogány, L., Koós, Margit, Tóth, László S., Zentai, G.
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Volume:
38-41
Year:
1989
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.38-41.1487
File:
PDF, 378 KB
1989
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