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Suppression of Al Memory-Effect on Growing 4H-SiC Epilayers by Hot-Wall Chemical Vapor Deposition
Ji, Shiyang, Kojima, Kazutoshi, Ishida, Yuuki, Yoshida, Sadafumi, Tsuchida, Hidekazu, Okumura, HajimeVolume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.52.04CP04
Date:
April, 2013
File:
PDF, 429 KB
english, 2013