Effect of STI-induced mechanical stress on leakage current...

Effect of STI-induced mechanical stress on leakage current in deep submicron CMOS devices

Rui, Li, Liu-Jiang, Yu, Ye-Min, Dong, Ching-Dong, Wang
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Volume:
16
Language:
english
Journal:
Chinese Physics
DOI:
10.1088/1009-1963/16/10/047
Date:
October, 2007
File:
PDF, 375 KB
english, 2007
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